Re:Neet

Precomputed grid headline

On the same cohort of 2,000 students, 5 papers, and 10 replications, rank recovery against true ability barely moves across the whole marking grid: 0.948 at worst and 0.966 at best. Measurement quality is not where the marking scheme earns its keep.

The guess rate is all or nothing. Which side a cell falls on turns on a single line: a blind shot pays whenever the correct mark is more than three times the penalty. The interactive controls below let you poke at that cliff yourself.

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Technical appendix: long-run measurement targets

These long-run IRT targets sit beyond the near-term normalization design.

ParameterTargetNote
Target reliability≥ 0.92, stretch 0.95Marginal reliability
Discrimination a0.8 to 2.0, reject < 0.5Avoid uniformly maximal discrimination
Difficulty b-0.5 to +2.0 logitsDenser near merit cutoffs
Point-biserial≥ 0.20, prefer ≥ 0.30Screening threshold
Guessing c~0.10 to 0.253PL range for four options
Anchors≥ 20 to 25%For equating and drift monitoring
Annual refresh~0.30Exposure-driven retirement
Pretest N per item200-500 (1PL), 500-1,000 (2PL), 1,000-2,000+ (3PL)Calibration sample
Iᵢ(θ) = D²·aᵢ²·Pᵢ(1−Pᵢ) ;   I(θ) = Σ Iᵢ(θ) ;   SE(θ) = 1/√I(θ) ;   ρ ≈ σ²θ / (σ²θ + SDz)

At 20 to 30 lakh candidates, pretest breadth is the constraint, not per-item sample size.